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FJ-5 research grade microscope is for the semiconductor industry, wafer manufacturing, electronic information industry, metallurgy industry needs, and as a senior optical microscope users to experience when using their superior performance, can be widely used in semiconductor , FPD, circuit packaging, circuit board, materials, castings / metal / ceramic components, precision mold testing. The instrument uses two kinds of lighting in the form of reflection and transmission, illumination in reflected light can be observed and DIC observation of light and dark field, polarized light observation. Mainly as the transmitted light bright field observation. Stable, high-quality optical system to image clarity, contrast and better. Ergonomic requirements of the design, so that you feel comfortable at work and relax.
FEATURES
1. UIS using high-resolution, long working distance infinity corrected optical lens imaging system. 2. Multiplexing to expand the objective lens, infinity objective lens is compatible with all observations, including light and dark vision wears method, polarized light method, DIC, and in each observation in both high-definition image quality. 3. Kohler illumination with non-spherical, an increase observed brightness. 4. WF10 × (Φ25) super-vision lens, light and dark field long working distance metallurgical objective lens. 5. DIC differential interference devices can plug the converter.
Technical Specifications
Observation of the first hinge 30 ° Trinocular (50mm-75mm)
Eyepiece WF10 × / 25mm
WF10 × / 20mm, with 0.1mm Cross Reticle
Flat-field lens at infinity long work. From the light and dark field objective: 5 × / 0.1BD/WD29.4mm, 10 × / 0.25BD/WD16mm, 20 × / 0.40BD/WD10.6mm, 40 × / 0.60BD/WD5.4 mm,
DIC converter with four-hole adapter jack
Double mobile platform platform
Platform Size: 189mm × 160mm
Moving range: 80mm × 50mm
Interpolation filter plate filter (green, blue, neutral)
Condenser NA1.25 Abbe condenser with Iris Diaphragm and filter
Focus thick, Coaxial focus, the use of rack and pinion drive mechanism. Micro cell value 0.002mm
Transmission illumination light source: halogen lamp 12V/50W, AC85V-230V, adjustable brightness
Vertical illumination: with aperture diaphragm and field of light bars, halogen 12V/50W, AC85V-230V, adjustable brightness
The analyzer polarizer device can rotate 360 degrees, the polarizer, the analyzer can be out of the optical
Detection Tool 0.01mm Gauge
Annex D measurement software for
Metallographic image analysis software professional
Vertical illumination: halogen 12V/100W, AC85V-230V, adjustable brightness
Flat-field long working distance infinity light and dark field objective lens: 50 × / 0.55BD/WD5.1mm, 80 × / 0.75BD/WD4mm, 100 × / 0.80BD/WD3mm
Eyepiece micrometer
1300000, 2000000, 3000000, 500 million pixel CMOS electronic eyepiece
CCD camera device and the interface to 0.5 ×, 0.57 ×, 0.75 ×
DIC (10 ×, 20 ×, 40 ×, 100 ×)
Flattening machine
Color 1 / 3 inch CCD 520 line
LED FJ-5 with a microscope
